Failure-tolerant computer design / William H. Pierce.
Publication details: New York : Academic Press, 1965.Description: xiii, 242 p. : ill. ; 24 cmSubject(s): DDC classification:- 004 22 PIE
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Book Open Access
|
Engineering Library | 004 PIE 1 (Browse shelf(Opens below)) | 1 | Available | 0015156 |
Content
Chapter I. Introduction to Redundancy Theory
A. Basic Concepts for Making Reliable Computers out Unreliable Parts
B. Error Types and Reliability Types
etc
Chapter II. Limit Theorems: A Foundation for Redundancy Theory
A. Introductory Ideas on Reliability Synthesis
B. Reliability Asymptotes of Paralleled units
C. Reliability of Multiple-Function System with Paralleled Individuals Units
etc
Chapter III. Decision theory in Redundant Systems
A. Concepts and Techniques
B. The Linearly Separable Decision Element
C. Decision Theory and Vote-Taking
etc.
Chapter IV. Adaptive Decision Elements
A. Cyclic Error-counting Adaption Procedures
B. Incremental Adaption procedures
C. Placement of Decision Elements in Redundant Networks
D. System Reliability
etc
Chapter V. Interconnection Structure for Redundant Logic (the Theory of interwoven Redundant Logic)
A. Vocabulary for Interwoven Logic
B. Restoring Organs
C. Interwoven Logic with Single-Layer Error Correction.
etc
Chapter VI. Redundant Relay Theory
A. The h(p) Function
B. The Moore-Shannon limit theorem.
C. Other Reliable Techniques Related to the Moore and Shannon Paper problem
Chapter VII. The Place, if Any, of Coding Techniques in Failure Tolerant digital Networks
A. Historical Background
B. Synthesis Example
C. Placement of Decoders
D. Decoder Complexity
Chapter VIII. Transition Analysis in Reliability Theory
A. Introduction to Markov Chain Theory
B. Two Reliability Problems for Non redundant Systems
C. Reliability Analyses for chains of Restoring Organs
etc.
"References": p. 221-[222] "Bibliography or redundancy techniques, compiled by Paul A. Jensen": p. 223-237.
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