Semi Conductor devices measurements and tests / G. Grin

CONTENT

Chapter One.
MEASUREMENTS AND MEASURING INSTRUMENTS
1.1. Measuring Methods
1.2 Errors in Measument
1.3 Classification of electrical measuring instruments by reading method
1.4 Instruments for Non electrical temperature measurements
etc.

Chapter Two
FUNDAMENTALS OF SEMICONDUCTOR DEVICES
2.1 General
2.2 Semiconductor Diodes
2.3 Transistors
2.4 Field-effect Transistors
etc.

Chapter Three
TECHNOLOGY ARSENAL FOR SEMICONDUCTOR DEVICES
3.1 Fabrication requirements
3.2 Methods for p-n junction fabrication
3.3 Fabrication of Ohmic Contacts
3.4 Advanced production techniques for semiconductor structures
etc.

Chapter Four.
MEASURING CIRCUITS
4.1 Essentials of Service Documentation
4.2 Block Diagrams of Measuring Units
4.3 Power Supply Units
4.4 Amplifiers
etc.

Chapter Five
MEASUREMENTS OF PARAMETERS OF SEMICONDUCTOR DEVICES
5.1 Purpose and Methods of Measurements
5.2 Measurements of Rectifier Diodes
5.3 Measurements of high-Frequency and Ultra high-Frequency Diodes
5.4 Measurements of Pulse diodes
etc.

Chapter Six
TESTS OF SEMICONDUCTOR DEVICES
6.1 Environmental effects on Semiconductor devices
6.2 Classification of texts
6.3 Design - Qualification tests
6.4 Climatic tests
etc.

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