000			01770nam a22001697a 4500
999			_c7753 _d7753
003			OSt
005			20211115134739.0
008			211115b ||||| |||| 00| 0 eng d
040			_aBUL _bENG _cBUL _dBUL _eRDA
082			_222 _a745.592 _bGRI
100			_aGrin,G.
245			_aSemi Conductor devices measurements and tests / _cG. Grin
260			_aMoscow, _bMir Publishers : _c1980 .
300			_a207 cm. _bill .: _c24 cm.
500			_aCONTENT Chapter One. MEASUREMENTS AND MEASURING INSTRUMENTS 1.1. Measuring Methods 1.2 Errors in Measument 1.3 Classification of electrical measuring instruments by reading method 1.4 Instruments for Non electrical temperature measurements etc. Chapter Two FUNDAMENTALS OF SEMICONDUCTOR DEVICES 2.1 General 2.2 Semiconductor Diodes 2.3 Transistors 2.4 Field-effect Transistors etc. Chapter Three TECHNOLOGY ARSENAL FOR SEMICONDUCTOR DEVICES 3.1 Fabrication requirements 3.2 Methods for p-n junction fabrication 3.3 Fabrication of Ohmic Contacts 3.4 Advanced production techniques for semiconductor structures etc. Chapter Four. MEASURING CIRCUITS 4.1 Essentials of Service Documentation 4.2 Block Diagrams of Measuring Units 4.3 Power Supply Units 4.4 Amplifiers etc. Chapter Five MEASUREMENTS OF PARAMETERS OF SEMICONDUCTOR DEVICES 5.1 Purpose and Methods of Measurements 5.2 Measurements of Rectifier Diodes 5.3 Measurements of high-Frequency and Ultra high-Frequency Diodes 5.4 Measurements of Pulse diodes etc. Chapter Six TESTS OF SEMICONDUCTOR DEVICES 6.1 Environmental effects on Semiconductor devices 6.2 Classification of texts 6.3 Design - Qualification tests 6.4 Climatic tests etc. sk
942			_2ddc _cBO _e22 _h621.38152 _i1 _kGRI _m621.38152 GRI