Semi Conductor devices measurements and tests /
G. Grin
- Moscow, Mir Publishers : 1980 .
- 207 cm. ill .: 24 cm.
CONTENT
Chapter One. MEASUREMENTS AND MEASURING INSTRUMENTS 1.1. Measuring Methods 1.2 Errors in Measument 1.3 Classification of electrical measuring instruments by reading method 1.4 Instruments for Non electrical temperature measurements etc.
Chapter Two FUNDAMENTALS OF SEMICONDUCTOR DEVICES 2.1 General 2.2 Semiconductor Diodes 2.3 Transistors 2.4 Field-effect Transistors etc.
Chapter Three TECHNOLOGY ARSENAL FOR SEMICONDUCTOR DEVICES 3.1 Fabrication requirements 3.2 Methods for p-n junction fabrication 3.3 Fabrication of Ohmic Contacts 3.4 Advanced production techniques for semiconductor structures etc.
Chapter Four. MEASURING CIRCUITS 4.1 Essentials of Service Documentation 4.2 Block Diagrams of Measuring Units 4.3 Power Supply Units 4.4 Amplifiers etc.
Chapter Five MEASUREMENTS OF PARAMETERS OF SEMICONDUCTOR DEVICES 5.1 Purpose and Methods of Measurements 5.2 Measurements of Rectifier Diodes 5.3 Measurements of high-Frequency and Ultra high-Frequency Diodes 5.4 Measurements of Pulse diodes etc.
Chapter Six TESTS OF SEMICONDUCTOR DEVICES 6.1 Environmental effects on Semiconductor devices 6.2 Classification of texts 6.3 Design - Qualification tests 6.4 Climatic tests etc.